HL 79: Photovoltaics: Mainly Silicon
Donnerstag, 17. März 2011, 14:30–17:15, FOE Anorg
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14:30 |
HL 79.1 |
Microstructuring of silicon with femtosecond laser pulses — •Waldemar Freund, Jan P. Richters, Tobias Voß, and Jürgen Gutowski
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14:45 |
HL 79.2 |
Potential of silicon nanoparticles for photovoltaic applications — •Martin Meseth, Pawel Ziolkowski, Nils Petermann, Gabi Schierning, Niels Benson, Hartmut Wiggers, and Roland Schmechel
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15:00 |
HL 79.3 |
Simulation of polycrystalline silicon thin film solar cells - model calibration and sensitivity analysis — •Ana-Maria Teodoreanu, Caspar Leendertz, Tobias Sontheimer, and Bernd Rech
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15:15 |
HL 79.4 |
Numerical 3D-Simulation of Micromorph Silicon Thin Film Solar Cells — •Stefan Geißendörfer, Jürgen Lacombe, Karsten von Maydell, and Carsten Agert
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15:30 |
HL 79.5 |
Modulated photoluminescence studies for lifetime determination in amorphous-silicon based passivation of crystalline-silicon wafers — •Florian Effenberg, Rudolf Brüggemann, and Gottfried H. Bauer
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16:00 |
HL 79.6 |
(contribution withdrawn) Shunts in Thin-Film Photovoltaics — •Stephanie Malek, Uli F. Wischnath, Juan Rechid, Ingo Riedel, and Jürgen Parisi
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16:15 |
HL 79.7 |
Scanning Spreading Resistance Microscopy for Characterization of Laser Doped Selective Emitter Structures in Solar Cells — •Stefan Doering, Stefan Jakschik, Thomas Mikolajick, Jens Krause, Rico Böhme, and Marc Petri
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16:30 |
HL 79.8 |
Comparison of the annealing treatments of PVD and ALD Al2O3 passivated silicon for solar cell applications — •Frank Benner, Maria Tarasova, Steve Kupke, Stefan Jakschik, and Thomas Mikolajick
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16:45 |
HL 79.9 |
Estimation of the excess carrier concentration from the spectral photoluminescence yield — •Sebastian Knabe and Gottfried H. Bauer
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17:00 |
HL 79.10 |
(Beitrag abgesagt) Charakterisierung von WS2-Korngrenzen mit ortsaufgelösten Rasterkraftmikroskopietechniken (CAFM, KPFM) — •Roman Mankowsky, Klaus Ellmer und Stephan Brunken
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