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HL: Fachverband Halbleiterphysik

HL 85: Poster Session II

HL 85.10: Poster

Donnerstag, 17. März 2011, 18:00–21:00, P4

Magneto-Optical Ellipsometry of Ferromagnetic Thin Films — •Tobias Herzig, Tammo Böntgen, Rüdiger Schmidt-Grund, Michael Lorenz, and Marius Grundmann — Universtät Leipzig, Institut für Experimentelle Physik II, Linnéstr. 5

We have investigated the optical properties of ferromagnetic thin films by means of spectroscopic ellipsometry. From the Müller Matrix (MM) obtained through these measurements one can derive the optical constants as well as the magneto-optical properties of the sample. The diagonal MM elements are a measure for the optical constants (refraction index, absorption). They were modeled using tabulated reference for the refractive index and absorption from the literature. The off-diagonal MM elements on the other hand contain information about the energy conversion between polarization modes. Thus modeling these elements gives inside into the magneto-optical properties of the sample. We determined these properties for Cobalt and magnetite thin films as model systems. The method proved to be a reliable tool to measure important optical properties and magneto-optical effects simultaneously.