Dresden 2011 – scientific programme

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HL: Fachverband Halbleiterphysik

HL 85: Poster Session II

HL 85.40: Poster

Thursday, March 17, 2011, 18:00–21:00, P4

Effect of the interface structure on the cross-plane thermoelectric transport in laterally microstructured ZnO-based stripe structures — •Steve Petznick, Gerd Homm, Martin Eickhoff, Bruno K. Meyer, and Peter J. Klar — 1. Physikalisches Institut, Justus-Liebig-Universität Gießen, Heinrich-Buff-Ring 16, 35392 Gießen, Deutschland

As a starting material MBE-grown ZnO was used, into which stripe structures perpendicular to the direction of the heat gradient or external electric field, and thus the current, were microstructured using photolithography, followed by wet-chemical etching. After the etching ZnO:Ga was sputtered into the grooves between the host material.

As the current must flow through the interfaces, all interface parameters will effect the transport behavior significantly. The shape of the interfaces of different samples is varied systematically to simulate different surface roughnesses. Temperature dependent measurements of the Seebeck coefficient and the electric conductivity will be performed in the temperature range from 80 K to 300 K. The results will be compared with a theoretical simulation based on a network model and other measurement series.