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HL: Fachverband Halbleiterphysik

HL 87: ZnO: Growth and Defects

HL 87.5: Vortrag

Freitag, 18. März 2011, 11:15–11:30, POT 51

Dominant Laplace DLTS peaks E280 and E290 in melt-grown ZnO — •Leopold Scheffler, Vladimir Kolkovsky, and Jörg Weber — Technische Universität Dresden, 01062 Dresden, Germany

In the present study single-crystal ZnO grown from the melt was investigated by electrical measurements such as DLTS and high-resolution Laplace DLTS. A peak E280 dominates the DLTS spectrum in the wide temperature range of 20-450 K. Using high-resolution Laplace DLTS this peak was found to consist of two levels with activation energies of 280 meV and 290 meV below the conduction band, respectively. The relative intensities of these peaks depend on the measurement temperature. The thermal stability of the defects in oxygen and oxygen-lean atmosphere is analyzed. The origin of these defects will be discussed.