KR 6: Poster: Crystallography in Materials Science
Mittwoch, 16. März 2011, 15:00–17:30, P1
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15:00 |
KR 6.1 |
Investigation of the Mosaicity of Real Crystals — •Anne Kathrin Hüsecken, Oleg Schmidt, and Ullrich Pietsch
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15:00 |
KR 6.2 |
Modeling of Defects in Silicon Nitride — •Torsten Weißbach, Steve Schmerler, and Jens Kortus
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15:00 |
KR 6.3 |
Polarization dependent Diffraction Anomalous Fine Structure studies of TiO2. — •Carsten Richter, Matthias Zschornak, Dmitri Novikov, Hartmut Stöcker, and Dirk C. Meyer
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15:00 |
KR 6.4 |
X-ray diffractometry of magnetic (Ga,Mn)As epitaxial layers — •Vaclav Holy, Xavier Marti, Lukas Horak, Vit Novak, and Tobias Schuelli
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15:00 |
KR 6.5 |
Oxygen nonstoichiometry of tetragonal La2-xSrxCuO4-δ (x = 0.15 - 1.2) and in situ XPS studies at elevated temperatures — •Daria Mikhailova, Vladimir Alyoshin, Steffen Oswald, and Helmut Ehrenberg
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