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MA: Fachverband Magnetismus

MA 32: Magnetic Thin Films I

MA 32.5: Vortrag

Mittwoch, 16. März 2011, 12:00–12:15, HSZ 04

Magnetic properties of Permalloy elements fabricated by focused-ion-beam-based methods — •Saleh Getlawi, Nikolas Becker, Haibin Gao, Michael Koblischka, and Uwe Hartmann — Inst. of Experimental Physics, Saarland University, P.O. Box 151150, 66041 Saarbrücken

Focused-ion-beam (FIB) irradiation and milling are very versatile and rapid laboratory techniques for structuring small elements from thin films. The purpose of this work is a systematic comparison of the magnetic properties of Permalloy(Py,Ni81FE19) thin elements prepared by conventional electron beam lithography (EBL) and by FIB-based methods. In particular effects of Ga+ ion irradiation on structural and magnetic properties were investigated. A variety of Py nanowires of 20nm thickness and 200nm width were prepared. The wires have notches for domain wall pinning and pads of different geometry for domain wall nucleation. Atomic and magnetic force microscopy were used for structural and magnetic characterization. The influence of Ga+ irradiation was found to be significant.