Dresden 2011 – scientific programme

Parts | Days | Selection | Search | Updates | Downloads | Help

MA: Fachverband Magnetismus

MA 62: Magnetic Imaging

MA 62.5: Talk

Friday, March 18, 2011, 11:45–12:00, HSZ 04

A combined Laser-scanning / Wide-field Kerr Microscope to Investigate the Switching Behavior of Nanomagnetic Logic Devices — •Stephan Breitkreutz, Josef Kiermaier, Benedikt Neumeier, Markus Becherer, and Doris Schmitt-Landsiedel — Lehrstuhl für Technische Elektronik, TU München

Nanomagnetic Logic (NML) is a promising candidate for future computing devices with inherent logic and memory function in every single device. In order to observe and develop NML, fast and high-resolution measurement techniques are required.
Based on the polar magneto-optical Kerr effect (p-MOKE) we developed a scanning microscope combining two different mode to characterize single nanomagnets and record high-resolution images of magnetic samples. In laser-scanning mode the sample is scanned with a blue laser achieving a resolution down to 400 nm. This allows to measure hysteresis curves of single nanomagnets and high-resolution images of dot configurations. The setup provides field sweeping rates of 10 T/s and time resolved observation of switching events in the 10-µs-range. In wide-field mode the sample is illuminated by homogeneous, highly polarized LED light and analyzed with a 1280·1024 pixel CMOS-camera with 27 frames/s. This allows for fast image analysis of large arrays of nanomagnets e.g. to observe dot interactions due to coupling and signal propagation in nanomagnetic gates.
Performed measurements demonstrate the versatility of the combined measurement mode for development and optimization of NML devices.