Dresden 2011 – scientific programme

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MA: Fachverband Magnetismus

MA 63: Poster II (Surface Magnetism/ Magnetic Imaging/ Topological Insulators/ Spin Structures and Magnetic Phase Transitions/ Graphene/ Magnetic Thin Films/ Magnetic Semiconductors/ Magnetic Half-metals and Oxides/ Spin-dependent Transport/ Spin Excitations and Spin Torque/ Spin Injection and Spin Currents in Heterostructures/ Spintronics/ Magnetic Storage and Applications)

MA 63.34: Poster

Friday, March 18, 2011, 11:00–14:00, P2

In-Situ STM, LEED and MOKE Measurements of Ultrathin Epitaxially Flat Grown Fe Films on the GaAs(110) Surface — •Tim Iffländer, Martin Wenderoth, Thomas Druga, Lars Winking, and Rainer G. Ulbrich — IV. Phys. Inst., Georg-August-Universität Göttingen

Fe films of up to 8 ML thickness were deposited on in-situ cleaved n-, p-, and i-GaAs(110) in a two-step process combining low-temperature deposition at 130 K with a subsequent annealing to room temperature. LEED and STM measurements suggest an abrupt interface without any considerable amount of compound formation.

In-situ longitudinal MOKE measurements at RT were conducted for different in-plane orientations of the applied magnetic field with respect to the sample. In contrast to RT grown Fe films of 2-3 ML thickness, the easy and hard axes are interchanged, now parallel to [001] and [110], respectively. The hysteresis loop of films thicker than or equal to 5 ML is equivalent to magnetization curves observed in the case of RT grown films.

Furthermore, we observe a new phenomenon in the 2-3 ML thickness regime: the sense of the hysteresis loops for steep angles of incidence is not determined by the orientation of the magnetic field but linked to the crystallographic orientation of our substrate. From that we conclude a polar magnetization component induced by the epitaxially grown interface.

This work was supported by the DFG SFB 602 TP A7 and SPP 1285.