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MI: Fachverband Mikrosonden

	So, 16:00–19:15	HSZ 401	MI 1: Tutorial on State of the Art of X-Ray Microanalysis
	Mo, 09:30–13:15	BEY 81	MI 2: Electron Backscattering and Kossel X-Ray Diffraction
	Mo, 14:30–16:45	BEY 81	MI 3: TEM- and SEM-based Material Analysis
	Mo, 17:30–19:30	P5	MI 4: Poster: Microanalysis and Microscopy
	Di, 09:30–12:45	BEY 81	MI 5: X-Ray Spectrometry and Tomography