Dresden 2011 – wissenschaftliches Programm
Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe
MM: Fachverband Metall- und Materialphysik
MM 14: Topical Session TEM IV
MM 14.3: Vortrag
Dienstag, 15. März 2011, 12:00–12:15, IFW A
Quantitative High-Resolution Transmission Electron Microscopy of Single PlatinumAtoms — •Björn Gamm1, Radian Popescu1, Holger Blank1, Reinhard Schneider1, Dagmar Gerthsen1, André Beyer2, and Armin Gölzhäuser2 — 1Laboratorium für Elektronenmikroskopie, Karlsruher Institut für Technologie, 76131 Karlsruhe, Germany — 2Physik Supramolekularer Systeme, Universität Bielefeld, 33501 Bielefeld, Germany
Single atoms can be considered as the most basic objects to be imaged in an electron microscope and can therefore be used to test the image contrast model which comprises the electron-atom interaction and image formation in the microscope. In this work a quantitative comparison of simulated and experimental high-resolution transmission electron microscopy (HRTEM) images of single Pt-atoms is performed to test the basic image contrast model. Single Pt-atoms were deposited on a self-assembled monolayer substrate and imaged by HRTEM using an aberration-corrected microscope. The negligible contrast of the substrate allows the quantification of single-atom contrast. Image simulations are performed on the basis of Weickenmeier-Kohl and Doyle-Turner scattering factors. Objective-lens aberrations as well as the effects of partial coherence and MTF of the CCD camera are considered. The contrast from the simulations is compared with the experimentally measured contrast. Peak intensity and full width at half maximum are determined. For these properties full agreement on an absolute intensity scale is found within the error limits for WK scattering factors.