MM 14: Topical Session TEM IV
Dienstag, 15. März 2011, 11:00–13:00, IFW A
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11:00 |
MM 14.1 |
Topical Talk:
Transmission Electron Microscopy at 20 kV for Imaging and Spectroscopy - Current Status and Future Prospects — •U. Kaiser, J. Biskupek, J.C. Meyer, J. Leschner, L. Lechner, Z. Lee, S. Kurasch, U. Golla-Schindler, M. Kinyanjui, H. Rose, M. Stöger-Pollach, A.N. Khlobystov, M. Haider, P. Hartel, H. Müller, S. Eyhusen, and G. Benner
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11:30 |
MM 14.2 |
Topical Talk:
Quantification of instrumental properties in high-resolution transmission electron microscopy — •Juri Barthel and Andreas Thust
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12:00 |
MM 14.3 |
Quantitative High-Resolution Transmission Electron Microscopy of Single PlatinumAtoms — •Björn Gamm, Radian Popescu, Holger Blank, Reinhard Schneider, Dagmar Gerthsen, André Beyer, and Armin Gölzhäuser
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12:15 |
MM 14.4 |
Applications of CS-corrected TEM in metal nitride hard coating materials — •Zaoli Zhang, Boriana Roshkava, Rostislav Daniel, Christian Mitterer, Gerhard Dehm, Petr Lazar, Josef Redinger, and Raimund Podloucky
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12:30 |
MM 14.5 |
Optimum TEM imaging conditions for graphene at low and medium voltages — •Zhongbo Lee, Ute Kaiser, Jannik Meyer, and Harald Rose
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12:45 |
MM 14.6 |
Quantitative scanning transmission electron microscopy at low energies — •Erich Müller, Marina Pfaff, Holger Blank, Tobias Volkenandt, Felix Bleimund, and Dagmar Gerthsen
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