MM 22: Topical Session TEM VI
Mittwoch, 16. März 2011, 11:00–13:00, IFW B
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11:00 |
MM 22.1 |
Topical Talk:
In-situ TEM: Atomistic Insights into Crystallisation — •Christina Scheu
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11:30 |
MM 22.2 |
Topical Talk:
Quantitative Nanoscale Analysis in 3D using Electron Tomography — •Christian Kübel
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12:00 |
MM 22.3 |
In-situ Transmission Electron Microscopy of Material Transport and Crystallization during the Al induced layer exchange (ALILE) process — •Balaji Birajdar, Tobias Antesberger, Martin Stutzmann, and Erdmann Spiecker
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12:15 |
MM 22.4 |
In situ tensile testing of Au nanowires — •Burkhard Roos, Bahne Kapelle, Gunther Richter, and Cynthia A. Volkert
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12:30 |
MM 22.5 |
Optimization of STEM Tomography Acquisition - A Comparison of Convergent Beam and Parallel Beam STEM Tomography — •Johannes Biskupek, Jens Leschner, Paul Walther, and Ute Kaiser
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12:45 |
MM 22.6 |
3D electron tomography of biological photonic crystals — •Benjamin Butz, Benjamin Winter, Benito Vieweg, Isabel Knoke, Stefanie Spallek, Gerd Schröder-Turk, Klaus Mecke, and Erdmann Spiecker
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