Dresden 2011 – wissenschaftliches Programm
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MM: Fachverband Metall- und Materialphysik
MM 26: Topical Session TEM VII
MM 26.1: Topical Talk
Mittwoch, 16. März 2011, 14:30–15:00, IFW B
Electron Holography for structures and fields at a nanoscale — •Hannes Lichte1, Dorin Geiger1, Andreas Lenk1, Martin Linck1,2, Axel Lubk1,3, Falk Roeder1, John Sandino1,4, Jan Sickmann1, Karin Vogel1, and Daniel Wolf1 — 1Triebenberg Laboratory, Institute for Structure Physics, TU Dresden, 01062 Dresden, Germany — 2National Center for Electron Microscopy Lawrence Berkeley National Laboratory One Cyclotron Road, MS 72-150 Berkeley, CA 94720 — 3CEMES-CNRS - Groupe NanoMatériaux 29, rue Jeanne Marvig B.P. 94347 F-31055 Toulouse Cedex — 4Facultad de ciencias Universidad Nacional de Colombia Sede Bogota, Colombia
TEM is the method of choice for analysis of materials at atomic scale at point resolution below 0.1nm allowing interpretation of positions of atoms e.g. at interfaces. However, the phases are lost, and hence the electric and magnetic fields in the object. Phase-loss is overcome by electron holography [1]. This allows access to **Inner Potentials in solids **Functional potentials such as pn-junctions **Electric fields controlling growth in biominerals **Depolarizing fields in ferroelectrics **Magnetic fields in magnetic structures **difference of atomic numbers **number of atoms in an atomic column **Coherence of inelastically scattered electrons Lateral resolution of 0.1nm is reached. Phase resolution presently is about 2p/70, just at the edge for detecting interatomic electric fields. [1] H. Lichte, M. Lehmann, Rep. Prog. Phys. 71 (2008), 016102. Funding by DFG,German-Israel Funds (GIF), European Union (Framework 6 Integr. Infrastruct., Reference 026019 ESTEEM).