MM 29: Topical Session TEM VIII
Mittwoch, 16. März 2011, 15:45–17:00, IFW B
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15:45 |
MM 29.1 |
Quantitative TEM-EDX analysis of compositional inhomogeneities in CIGS absorbers — •Isabel Knoke, Benito Vieweg, Stefan Jost, Jörg Palm, and Erdmann Spiecker
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16:00 |
MM 29.2 |
Determination of Nitrogen Concentration in Dilute GaNAs by STEM HAADF Z-Contrast Imaging — •Tim Grieb, Knut Müller, Oleg Rubel, Rafael Fritz, Marco Schowalter, Kerstin Volz, and Andreas Rosenauer
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16:15 |
MM 29.3 |
Quantitative local profile analysis of nanomaterials based on TEM diffraction — •Christoph Gammer, Clemens Mangler, Hans-Peter Karnthaler, and Christian Rentenberger
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16:30 |
MM 29.4 |
Diffraction spots off the diffraction rings in severely deformed bulk nanocrystalline FeAl — •Anna Findeisen, Christoph Gammer, Christian Rentenberger, and Hans-Peter Karnthaler
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16:45 |
MM 29.5 |
TEM Studies on Etch Pit Formation during the Nucleation of 3C-SiC on Si(001) — •Julian Müller, Philip Hens, Peter Wellmann, and Erdmann Spiecker
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