Dresden 2011 – scientific programme

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MM: Fachverband Metall- und Materialphysik

MM 31: Postersitzung II

MM 31.32: Poster

Wednesday, March 16, 2011, 17:15–18:45, P5

(contribution withdrawn) Magnetoconductivity of ferromagnetic thin film samples probed by scanning microwave microscopy — •Stephan Streit¹, Ferry Kienberger², Hans-Peter Huber², Matthias Fenner³, Heidemarie Schmidt¹, and Manfred Helm¹ — ¹Helmholtz-Zentrum Dresden-Rossendorf, Bautzner Landstraße 400, 01314 Dresden — ²Agilent Technologies Austria GmbH, Aubrunnerweg 11, A-4040 Linz, Austria — ³Agilent Technologies Inc., 61476 Kronberg, Germany

Due to the miniaturisation of electrical devices, measurement techniques need to keep pace to achieve an appropriate spatial resolution. Scanning Microwave Microscopy (SMM) [1] offers the possibility to combine impedance measurements with the advantages of atomic force microscopy. In our work we use a SMM in contact mode to investigate the magnetoconductivity of ferromagnetic thin films. The samples have been prepared by electron beam deposition of iron, cobalt, or nickel films and a Cr protection layer on ZnO substrates. Our quantitative simulation is based on the dependence of the microwave reflection coefficient S11 on conductivity and permeability of ferromagnetic materials [1]. The influence of multiple microwave reflections [2] on the S11 coefficient has been tested for 10 and 20 nm thick ferromagnetic films.

[1] H. Melikyan et al., Ultramicroscopy 108 (2008) 1030-1033 [2] D.M. Pozar, Microwave Engineering, Wiley&Sons, 2005