Dresden 2011 – wissenschaftliches Programm

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MO: Fachverband Molekülphysik

MO 18: Experimental Techniques and Various Topics

MO 18.4: Vortrag

Mittwoch, 16. März 2011, 17:15–17:30, MER 02

Characterisation of Position Map Imaging (XMI) — •Johannes von Vangerow¹, Rico Otto¹, Martin Stei², Sebastian Trippel¹, Thorsten Best¹, Jonathan Brox¹, and Roland Wester² — ¹Physikalisches Institut, Universität Freiburg, Hermann-Herder-Str. 3, 79104 Freiburg — ²Institut f. Ionenphysik und Angewandte Physik, Universität Innsbruck, Technikerstr. 25/3, A-6020 Innsbruck

Imaging ionic reaction products using ion optics can be described as mapping the charged products initial state in phase space (x^→, m v^→) onto a 2D detector position and the ion time of flight (x, y, t). To extract different aspects of the phase space information, different imaging modes, i.e. Wiley Mc Laren type mass spectrometry, velocity map imaging and position map imaging can be used. Both mass and velocity imaging mode have been previosly analyzed [1][2], whereas the position imaging mode, even though well-known [1], hasn’t been characterised in detail so far. Here we report on how the imaging properties depend on the parameters of the system, i.e. geometry, applied voltages and initial phase space distribution of the particles. Measurements characterising the XMI mode will be compared with SIMION simulations. Possible applications of the XMI mode will be discussed.
A. T. Eppink, D. H. Parker, Rev. Sci. Instrum. 68, 3477 (1997).
W. C. Wiley, I. H. Mc Laren, Rev. Sci. Instrum. 26, 1150 (1955).