O 23: Scanning probe methods II
Montag, 14. März 2011, 17:15–19:15, WIL C307
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17:15 |
O 23.1 |
Simulation of a single molecule stretched within an nc-AFM junction — •Christian Wagner, Norman Fournier, Christian Weiss, Ruslan Temirov, and Frank Stefan Tautz
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17:30 |
O 23.2 |
A strange disturbance in the force — •Jay Weymouth, Thorsten Wutscher, Joachim Welker, Thomas Hofmann, and Franz Giessibl
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17:45 |
O 23.3 |
Simultaneous current and force microscopy on epitaxial graphene — •Thomas Hofmann, Markus Duschl, and Franz J. Giessibl
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18:00 |
O 23.4 |
Amplitude dependence of long- versus short-range forces on Si(111)7x7 — •Joachim Welker, Thomas Hofmann, and Franz J. Giessibl
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18:15 |
O 23.5 |
Ac and dc Conductivity measurements vs. KPFM - a methodical study — •Anne-Dorothea Müller, Falk Müller, Stefanie Wengel, Kin Mun Wong, and Yong Lei
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18:30 |
O 23.6 |
AFM an Nanodrähten: Oberflächenpotentiale und Dissipation aus abstandsabhängigen Resonanzkurven im intermittent-contact-Modus — •Moid Bhatti, Lars Ungewitter, Ivo Knittel und Uwe Hartmann
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18:45 |
O 23.7 |
Measuring forces in a single-molecule transport junction — •Norman Fournier, Christian Wagner, Christian Weiss, Ruslan Temirov, and Stefan Tautz
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19:00 |
O 23.8 |
Structure of the first water layer on Ru(0001) — •Sabine Maier, Ingeborg Stass, Peter J. Feibelman, and Miquel Salmeron
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