Dresden 2011 – scientific programme

Parts | Days | Selection | Search | Updates | Downloads | Help

O: Fachverband Oberflächenphysik

O 35: Poster Session I (Scanning probe methods)

O 35.12: Poster

Tuesday, March 15, 2011, 18:30–22:00, P3

Nano scale mechanical characterization of surfaces — •Alexander Malwin Jakob and S.G. Mayr — Leibniz-Institut fuer Oberflaechenmodifizierung, Translationszentrum fuer Regenerative Medizin und Fakultaet fuer Physik und Geowissenschaften der Universitaet Leipzig, 04318 Leipzig

With proceeding miniaturization in science and technology, mechanical properties at the nano scale have attracted increased interest during the past years. Although commercial nano indenters are widely available at this point, they usually probe the micro scale rather than measuring nano-mechanical properties. For real nanometer resolved mechanical characterization, atomic force microscope (AFM) based techniques like contact resonance force microscopy (CR-FM) are highly promising, as first proposed by Rabe and Arnold [1] as well as Yamanaka [2]. While our first setup employed a hardware realization of this technique [3], the present contribution deals with a purely software based implementation of CR-FM into a commercial AFM. Capabilities and limitations for exemplary surfaces are presented. The experimental studies are supplemented by finite element modeling of the cantilever-sample interaction.
This project is funded by the German BMBF, PTJ-BIO, Grant Number: 0313909.
Rabe U., Arnold W., Appl. Phys. Lett. Vol.64, P1493-1495 (1994)
Yamanaka K., Ogiso H., Kolosov O., Appl. Phys. Lett., Vol.64, P178-180 (1994)
C. Vree, Dissertation, Göttingen (2009)