Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe
O: Fachverband Oberflächenphysik
O 60: Poster Session IV (Solid/liquid interfaces; Semiconductors; Oxides and insulators; Graphene; Plasmonics and nanooptics; Electronic Structure; Surface chemical reactions; Heterogeneous catalysis)
O 60.53: Poster
Mittwoch, 16. März 2011, 17:30–21:00, P4
YIELD and Kelvin probe study of graphene — •Samir Mammadov, Jürgen Ristein, and Thomas Seyller — Lehrstuhl für Technische Physik, Universität Erlangen-Nürnberg, Germany
Subject of this study is the investigation of the work function and photo-YIELD of epitaxial graphene(EG) films. Two types of samples were investigated: regular EG films and H-intercalated EG films, referred to as quasi-freestanding graphene (QFG). EG films were formed by thermal decomposition on the Si-face of n-type 6H-SiC substrates and QFG samples were formed by subsequentially intercalating EG samples by hydrogen.
The work function was determined precisely for each type of samples.The YIELD spectra of the different samples display significant variation which will be discussed in details.