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O: Fachverband Oberflächenphysik
O 60: Poster Session IV (Solid/liquid interfaces; Semiconductors; Oxides and insulators; Graphene; Plasmonics and nanooptics; Electronic Structure; Surface chemical reactions; Heterogeneous catalysis)
O 60.79: Poster
Wednesday, March 16, 2011, 17:30–21:00, P4
Tuning resonant infrared antennas with phase change materials — •Kathrin Schönauer1, Jens Richter1, Xinghui Yin2, Jón Mattis Hoffmann1, and Thomas Taubner1,2 — 11st Institute of Physics, RWTH Aachen University, Sommerfeldstraße 14, 52074 Aachen, Germany — 2Fraunhofer Institute for Laser Technology, Steinbachstraße 15, 52074 Aachen, Germany
In the field of active plasmonics one recent interest lies in tunable resonances, e.g. for the use as optical switches [1]. Tuning of resonances of metallic nanostructures can be done by changing their dielectric environment. Phase change materials show a change of their refractive index between amorphous and crystalline phase. Especially in the mid-infrared spectral region some of these materials show the advantage of having low losses.
Thin films of phase change materials, e.g. Ge2Sb2Te5, are deposited by sputtering onto Si-substrates. On top of these films nanostructures are prepared by nanosphere lithography. We use Fourier-Transform Infrared Microscopy for measuring the resonance frequency of these infrared antennas.
A future application of these systems could be their use as tunable sensors for enhanced infrared spectroscopy [2-3].
[1] Z. L. Sámson et al., APL 96, 143105 (2010)
[2] R. Adato et al., PNAS, 106, 19227 (2009)
[3] F. Neubrech et al., PRL 101, 157403 (2008)