Dresden 2011 – scientific programme

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Q: Fachverband Quantenoptik und Photonik

Q 30: Photonics 2

Q 30.7: Talk

Wednesday, March 16, 2011, 12:00–12:15, SCH A118

Linear and Nonlinear Measurements on Silicon-Organic Hybrid Waveguide Structures — •Peter W. Nolte, Clemens Schriever, and Jörg Schilling — Centre for Innovation Competence SiLi-nano, Martin-Luther-University Halle-Wittenberg, Germany

In the last years great efforts lead to a strong miniaturization of optical components, as several devices were realized on the silicon-on-insulator (SOI) platform which is completely compatible to CMOS technology. The very high refractive index contrast between the Si core (n=3.5) and the oxide cladding (n=1.45) and air (n=1), respectively, leads to a high confinement of light inside a waveguide. However, for many applications active devices exhibiting a nonlinear optical behavior are needed. One possible way to boost the nonlinear optical properties in integrated optics is the functionalization of SOI-structures. This is achieved by a combination of Silicon with strongly nonlinear organic materials such as dyes. SOI-ridge-waveguides have been fabricated using standard CMOS-processing and coated with molten dyes. Linear poperties like mode index and propagation losses are determined from a Fourier evaluation of the Fabry Perot oscillations of the transmission spectra. Finally the nonlinear properties of these devices have been studied by degenerated four-wave-mixing measurements.