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Q: Fachverband Quantenoptik und Photonik

Q 52: Precision Measurement and Metrology 3

Q 52.3: Vortrag

Donnerstag, 17. März 2011, 15:00–15:15, HÜL 386

Enhancing the angular tolerance of resonant waveguide gratings — •Stefanie Kroker, Frank Brückner, Ernst-Bernhard Kley, and Andreas Tünnermann — Friedrich-Schiller-Universität, Institut für Angewandte Physik, Max-Wien-Platz 1, 07743 Jena

We present a novel concept to increase the angular tolerance of resonant waveguide gratings by stacking two resonant structures on top of each other. It is demonstrated that reflectivites close to unitiy can be reached over the entire angular spectrum by this double T-shaped grating configuration. The principles of our new approach can be used for gratings made of two different materials but also to realize monolithic silicon structures with similar properties. We illustrate that the functionality of the device can be understood by a decomposition into separated elements. Our concept might have applications as new diffractive-reflective optical components with low coating thermal noise in the field of high precision metrology.