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ST: Fachverband Strahlen- und Medizinphysik
ST 6: Imaging with Ionizing Radiation II
ST 6.2: Talk
Thursday, March 17, 2011, 14:15–14:30, POT 112
X-ray directional dark-field contrast for sub-pixel resolution imaging of bone microstructures — •Thomas Biernath1, Andreas Malecki1, Guillaume Potdevin1, Torben Jensen2, Martin Bech1, and Franz Pfeiffer1 — 1Department of Physics (E17) and Institute of Medical Engineering (IMETUM), Technische Universität München, Germany — 2Niels Bohr Institute, University of Copenhagen, Denmark
The basic principles of x-ray image formation in radiography have remained essentially unchanged since Röntgen first discovered x-rays over a hundred years ago. The conventional approach relies on x-ray absorption as the sole source of contrast and thus gives an information about the density changes in the sample. The recently introduced X-ray dark field imaging technique (DFI) yields a fundamentally different signal: DFI is a measure of the sample small angle scattering signal and thus yields information about the sample microstructure. Such measurements can be effectively performed thanks to a Lau-Talbot grating interferometer.
This presentation will show recent experimental directional dark-field imaging results of various samples both from synchrotron and classical X-ray tube sources.