Dresden 2011 – wissenschaftliches Programm

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TUT: Tutorials

TUT 4: State of the Art of X-Ray Microanalysis (MI)

TUT 4.3: Tutorium

Sonntag, 13. März 2011, 17:45–18:30, HSZ 401

Hard X-ray scanning microscopy and tomography with elemental, chemical, and structural contrast — •Christian G. Schroer — Institut für Strukturphysik, TU Dresden, 01062 Dresden, Germany

In this tutorial, hard x-ray scanning microscopy and tomography is reviewed. There is a growing demand for these techniques in many fields of science, from physics and chemistry, to materials, earth, and envrionmental science, biology and nanotechnology. The large penetration depth of hard x-rays in matter allows one to investigate the inside of a specimen without destructive sample preparation or inside a special sample environment, such as a chemical reactor or a pressure cell. In combination with tomographic techniques, the three-dimensional inner structure of the sample can be reconstructed. X-ray analytical techniques, such as fluorescence, absorption or scattering (SAXS, WAXS) can be used as contrast in the scanning microscope, yielding elemental, chemical, and nano-structural contrast. Currently, spatial resolutions around 50 nm are achieved. In combination with coherent x-ray diffraction imaging techniques, spatial resolutions down to 10 nm and below are reached. A variety of application examples are given.

[1] A. Schropp, et al., J. Microscopy (2010). DOI: 10.1111/j.1365 2818.2010.03453.x.

[2] C. G. Schroer, et al., Phys. Rev. Lett., 101 (9), 090801 (2008).

[3] C. G. Schroer, et al., Appl. Phys. Lett., 88 (16), 164102 (2006).

[4] C. G. Schroer, et al., Appl. Phys. Lett., 82 (19), 3360 (2003).

[5] C. G. Schroer, Appl. Phys. Lett., 79 (12), 1912 (2001).