Karlsruhe 2011 – wissenschaftliches Programm
Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe
T: Fachverband Teilchenphysik
T 62: Halbleiterdetektoren II
T 62.5: Vortrag
Dienstag, 29. März 2011, 17:45–18:00, 30.21: 001
Analysis methods of testbeam data of irradiated ATLAS Planar Pixel Sensors — Silke Altenheiner, Claus Gößling, Jennifer Jentzsch, Reiner Klingenberg, Daniel Muenstermann, André Rummler, •Georg Troska, and Tobias Wittig — TU Dortmund, Experimentelle Physik IV, D-44221 Dortmund
The ATLAS Pixel detector is the innermost subdetector of the ATLAS-Experiment at CERN. The development of new sensor technologies is going on as detector-upgrades are foreseen to cope with higher fluences and more pile-up-events after accelerator upgrades (SLHC).
For testing properties of sensors, testbeams are used. Beam-telescopes such as the EUDET-Telescope have been used for measuring the exact position of beam-tracks to determine the properties of different sensor technologies.
Several sensors with different designs (e.g. slim edges) were read-out in testbeam after irradiation at differing fluences (up to 2·1016 neqcm−2) and voltages (up to 1500 V) to observe the performance of the sensors under conditions up to the end-lifetime of the ATLAS detector.
The reconstruction chain of the so called Eutelescope framework including adaptions and the evaluation of the reconstructed data will be presented. Typical results including hit- and charge-efficiency plots will be shown and interpreted.