Berlin 2012 – wissenschaftliches Programm
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CPP: Fachverband Chemische Physik und Polymerphysik
CPP 13: Poster: Interfaces and Thin Films
CPP 13.9: Poster
Dienstag, 27. März 2012, 18:15–20:45, Poster A
In Situ Growth Studies of N-Alkanes on Silica with Real-Time X-Ray Methods — •Christopher Weber1, Christian Frank2, Wolfram Leitenberger3, Frank Schreiber2, and Stefan Kowarik1 — 1Institut für Physik, Humboldt Universität zu Berlin, 12489 Berlin — 2Institut für angewandte Physik, Universität Tübingen, 72076 Tübingen — 3Institut für Physik, Universität Potsdam, 14476 Potsdam-Golm
We use n-alkanes as a model system to study how the chain-length of molecules influences thin film growth. Because of their insulating properties n-alkanes also have attracted some technological attention. Recently they have been used with great success to improve the performance of an organic field effect transistor. Real-time x-ray methods combined with theoretical models allow us to monitor the growth process in situ, determine changes of the growth modes and follow the roughening of the films. Grazing Incidence X-ray Diffraction allowes to find also some chain-length dependency within the final film structures.