Berlin 2012 – wissenschaftliches Programm

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CPP: Fachverband Chemische Physik und Polymerphysik

CPP 30: New Perspectives of Scattering at Soft Matter

CPP 30.7: Hauptvortrag

Mittwoch, 28. März 2012, 17:00–17:30, C 264

Scanning small-angle X-ray scattering: Imaging nano-scale properties of extended samples — •Oliver Bunk — Paul Scherrer Institut, Swiss Light Source, 5232 Villigen PSI, Switzerland

Small-Angle X-ray scattering (SAXS) is sensitive to the average nanoscale structure within the illuminated area. With the advent of 3rd generation synchrotron radiation undulator beamlines, X-ray optics of adequate quality and fast, low noise, high dynamic range 2D X-ray detectors scanning SAXS turned from a proof-of-principle to a routinely applied imaging technique, applied in 2D and 3D. It allows imaging nano scale structures over extended, square centimeter sized areas.

After a brief introduction to the technique examples will be shown that include the detection of melt-flow induced alignment in injection moulding of polymers, carbon nanotube reinforced polycarbonate as a two-component system and examples from the biomedical field like bone and brain research that hint at future applications of this technique in the field of soft matter research.