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DF: Fachverband Dielektrische Festkörper

DF 8: Multiferroics III (jointly with MA, DS, KR, TT)

DF 8.1: Vortrag

Dienstag, 27. März 2012, 09:30–09:45, EB 301

Substrate influence on the strain in epitaxially grown BiCrO₃ thin films investigated using Raman spectroscopy and X-ray diffraction — •Andreas Talkenberger¹, Cameliu Himcinschi¹, Kannan Vijayanandhini², David Rafaja³, Ionela Vrejoiu², Torsten Weißbach¹, Christian Röder¹, and Jens Kortus¹ — ¹TU Bergakademie Freiberg, Institute of Theoretical Physics, D-09596 Freiberg — ²Max Planck Institute of Microstructure Physics, Weinberg 2, D-06120 Halle — ³TU Bergakademie Freiberg, Institute of Materials Science, D-09596 Freiberg

BiCrO₃ (BCO) is an interesting candidate for multiferroic applications. Therefore a deep understanding of the material properties and the fabrication of high quality epitaxial thin films is necessary. In this work we investigated epitaxially grown BCO thin films fabricated by pulsed laser deposition on SrTiO₃, LSAT, NdGaO₃ and DyScO₃ by means of Raman spectroscopy and X-ray diffraction (XRD). The shift of phonon modes at room temperature indicates different strains in the BCO films grown on the different substrates. Primarily, the XRD experiments helped to quantify the elastic lattice strains caused by the lattice misfit between the substrate and the thin films. The reciprocal space mapping was employed to follow the relaxation of the lattice strain through the formation of microstructure defects. This data was correlated to the observed Raman shifts. Using density functional theory the shifts of the Raman peaks were calculated for different strain states, and compared to the experimentally observed ones. This work is supported by the German Research Foundation DFG HI 1534/1-1.