Berlin 2012 – wissenschaftliches Programm

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DS: Fachverband Dünne Schichten

DS 16: Organic electronics and photovoltaics: simulations and optics II (jointly with CPP, HL, O)

DS 16.5: Vortrag

Dienstag, 27. März 2012, 12:30–12:45, H 2032

Two dimensional band structure mapping of organic single crystals using the new generation electron energy analyzer ARTOF — •A. Vollmer¹, R. Ovsyannikov¹, M. Gorgoi¹, S. Krause¹, M. Oehzelt¹, N. Martensson², S. Svensson², P. Karlsson³, M. Lundquist³, J. Pflaum⁴, T. Schmeiler⁴, and N. Koch^1,5 — ¹Helmholtz Zentrum Berlin für Materialien und Energie GmbH, Berlin, Germany — ²Uppsala University, Uppsala, Sweden — ³VG Scienta, Uppsala, Sweden — ⁴Universität Würzburg, Würzburg, Germany — ⁵Humboldt-Universität zu Berlin, Berlin, Germany

We report on a novel type of photoemission instrument, the Angle Resolved Time Of Flight analyzer (ARTOF 10k)electron energy analyser. The instrument facilitates the simultaneous recording of kinetic energy and angular pattern of photoelectrons in a cone of up to 30° opening angle with very high energy resolution (100 μeV). Its transmission (250 times higher than in hemispherical analysers)allows for very mild conditions during the experiment turning the ARTOF into the predestined instrument to investigate sensitive specimens such as organic single crystals, as extremely low photon fluxes can be used. Even though organic single crystals are of increasing fundamental and applied scientific interest, knowledge of their electronic properties is still mainly based on theoretical calculations due to major experimental challenges in measuring photoemission. Here we present the band structures of rubrene and tetracene single crystals obtained with unprecedented quality using the ARTOF instrument within only a few hours of measurement time.