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Berlin 2012 – scientific programme

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DS: Fachverband Dünne Schichten

DS 27: Thin film characterization: structure analysis and composition (post growth analysis XRD, etc..)

DS 27.4: Talk

Wednesday, March 28, 2012, 17:15–17:30, H 2032

Growth of lead-free piezoelectric thin films of 0.92 (Bi0.5Na0.5TiO3)-0.8 BaTiO3 (BNT-BT) by pulsed laser deposition — •Mehrdad Baghaie Yazdi, Christian Bausch, Torsten Granzow, Wook Jo, and Lambert Alff — Technische Universität Darmstadt, Darmstadt, Deutschland

Pulsed laser deposition (PLD) is one of the most versatile methods for growing complex oxide thin films. We have investigated the growth of the lead free piezoceramic BNT-BT (0.92 (Bi0.5Na0.5TiO3)-0.8 BaTiO3). By adjusting the growth conditions, it was possible to grow a multitude of different phases out of a single phase BNT-8BT polycrystalline target. All epitaxial films were grown on (100) SrTiO3 substrates, then reproduced on conducting STO:5%Nb to be used as bottom electrode. These thin films were studied by various X-ray diffraction methods and electrical properties were determined using a custom thin film measurement set-up.

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