Berlin 2012 –
wissenschaftliches Programm
DS 30: Thin film characterization: structure analysis and composition (TEM, LEED, PAS)
Donnerstag, 29. März 2012, 09:30–11:00, H 0111
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09:30 |
DS 30.1 |
TEM investigation of magnetically exchange coupled FeTb/[Co/Pt]n films — •Herbert Schletter, Christian Schubert, Birgit Hebler, Manfred Albrecht, and Michael Hietschold
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09:45 |
DS 30.2 |
Structural investigations of ferecrystals [(SnSe)1+x]m[TaSe2]1 by transmission electron microscopy — •Corinna Grosse, Ryan Atkins, Holm Kirmse, Wolfgang Neumann, and David C. Johnson
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10:00 |
DS 30.3 |
Quantification of LEED measurements. I. Systematic Errors — •Falko Sojka, Matthias Meissner, Marco Gruenewald, Roman Forker, and Torsten Fritz
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10:15 |
DS 30.4 |
Quantification of LEED measurements. II. Application to epitaxial organic films — •Matthias Meissner, Falko Sojka, Marco Gruenewald, Roman Forker, and Torsten Fritz
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10:30 |
DS 30.5 |
Interdiffusion in Au/Cu thin films studied by depth dependent CDBS — •Markus Reiner, Philip Pikart, and Christoph Hugenschmidt
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10:45 |
DS 30.6 |
Structural characterization of lead sheets for organ pipes by Positron Annihilation Spectroscopy — •Maik Butterling
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