Berlin 2012 – wissenschaftliches Programm
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DS: Fachverband Dünne Schichten
DS 37: Poster II: Focused electron beam induced processing for the fabrication of nanostructures (focused session, jointly with O); Nanoengineered thin films; Layer properties: electrical, optical, and mechanical properties; Thin film characterization: structure analysis and composition (XRD, TEM, XPS, SIMS, RBS,..); Application of thin films
DS 37.31: Poster
Donnerstag, 29. März 2012, 15:00–17:00, Poster E
Ultra-thin TiOx films on Pt(111): effect of the preparation parameters on the electronic and local structure. — •Mathias Glaser and Thomas Chassé — Universität Tübingen, Institut für Physikalische und Theoretische Chemie, Auf der Morgenstelle 18, 72076 Tübingen
Ultra-thin TiOx films on Pt(111) are promising model systems for the investigation of catalysis and are well suited for the investigation of oxide-oxide interphases. Carefully controlled preparation conditions are necessary during reactive evaporation of Ti in an O2 environment to obtain high quality films.
We investigated the electronic structure and the oxidation states of the different chemical elements of such ultra-thin films by x-ray photoelectron spectroscopy (XPS). The comparison of Ti2p core level spectra of different TiOx films shows the influence of different preparation parameters like evaporation and substrate temperature.
In order to investigate the local structure we used electron diffraction methods. Some of the films show the same patterns described in literature [1] before but were prepared by using other preparation parameters.
[1] F. Sedona et al., J. Phys. Chem. 2005, 109, 24411-24426.