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DS: Fachverband Dünne Schichten

DS 37: Poster II: Focused electron beam induced processing for the fabrication of nanostructures (focused session, jointly with O); Nanoengineered thin films; Layer properties: electrical, optical, and mechanical properties; Thin film characterization: structure analysis and composition (XRD, TEM, XPS, SIMS, RBS,..); Application of thin films

DS 37.33: Poster

Donnerstag, 29. März 2012, 15:00–17:00, Poster E

Spatially Resolved MOKE Spectroscopy — •Peter Richter, Michael Fronk, Alexander Kopylov, Dietrich R.T. Zahn, and Georgeta Salvan — Semiconductor Physics, Chemnitz University of Technology, 09107 Chemnitz

The measurement of the magneto-optic Kerr-effect (MOKE) yields information on the magnetic properties of para- and ferromagnetic thin films and can be used to characterize them with regard to spin polarization. This helps to assess their potential for spintronic devices or for modern magnetic data storage. Since samples of such materials often show structures on the micro- and nanoscopic scale, the use of a divergent light source with a large spot size (e.g. a Xe-lamp) for spectroscopic MOKE measurements provides averaged information. This work presents the experimental realization of a MOKE setup which uses a supercontinuum white light source (λ = 450 to 1000 nm) to achieve a µm-scale resolution for spatially resolved spectroscopic MOKE measurements. This setup furthermore allows measurements in the polar and in the longitudinal MOKE geometry, with the latter allowing materials with in-plane magnetic anisotropy to be investigated. The layout of the new setup and important hardware parts are described in detail. Finally, exemplary spatially resolved spectroscopic MOKE measurements of cobalt and nickel micro-electrodes for spintronic devices are presented.