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DS: Fachverband Dünne Schichten

DS 41: Thermoelectric materials III: Heterostructures (Focused session – Organizers: Meyer, Heiliger)

DS 41.2: Vortrag

Freitag, 30. März 2012, 09:45–10:00, H 2032

Experimental determination of the thermoelectric figure-of-merit and optimal annealing condition of electrodeposited films. — •Hans-Fridtjof Pernau, Martin Jägle, Alexandre Jacquot, Benjamin Bayer, Karina Tarantik, Olivia Herm, Harald Böttner, Jan König, and Kilian Bartholomé — Fraunhofer Institut für Physikalische Messtechnik IPM, Heidenhofstr. 8, 79110 Freiburg, Deutschland

Thermoelectric characterization tools developed at the Fraunhofer-IPM can not only be used for the characterization of thermoelectric properties, but also for optimization purposes. For example, thin film samples can be monitored on-line during annealing. These tools optimiza-tion technique is applicable for sputtered or electroplated films. An overview on the 3-omega method in combination with other measurement techniques allowing a determination of the figure of merit will be given.

This work presents the on-going efforts of the Fraunhofer-IPM to measure the thermoelectric figure of merit of electrodeposited or sputtered films and the fast determination of optimal an-nealing conditions.