Berlin 2012 – scientific programme

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DS: Fachverband Dünne Schichten

DS 44: Poster IV: Thin film photovoltaics; Organic electronics and photovoltaics (jointly with CPP, HL, O); Organic thin films; Trends in atomic layer deposition (Focused session)

DS 44.30: Poster

Friday, March 30, 2012, 09:30–12:00, Poster E

Interface analysis of aluminum doped zinc oxide sputtered on copper phthalocyanine thin films — •Cathy Jodocy, Ingolf Segger, Patrick Ries, and Matthias Wuttig — Institute of Physics (IA), RWTH Aachen University, 52056 Aachen, Germany

Organic electronics have attracted considerate attention due to their wide range of possible applications as well as their suitability for inexpensive and highly scalable processing techniques. Optoelectronic devices like organic solar cells and organic light-emitting diodes with a transparent top electrode are of interest since they allow a larger variety of organic-inorganic layer systems including semitransparent stacks.

We have deposited the transparent conductive oxide (TCO) material aluminum doped zinc oxide (ZnO:Al) as a top cathode above an organic layer. Copper phthalocyanine (CuPc) is an excellent material for the use as a donor in organic heterojunctions in organic solar cells. Furthermore its very rigid crystal structure is supposed to prevent degradation upon the impact of high kinetic energy particles generated during sputter deposition of the TCO. For the deposition of the ZnO:Al thin films we have used a dc magnetron sputtering process whereby layers with an excellent performance can be produced at low temperatures.

In this study a detailed investigation of the interface between sputtered ZnO:Al and the underlying CuPc layer is presented. The influence of sputter damage in the organic layer is characterized with photoelectron spectroscopy and x-ray diffraction measurements.