Berlin 2012 – scientific programme

Parts | Days | Selection | Search | Updates | Downloads | Help

DS: Fachverband Dünne Schichten

DS 44: Poster IV: Thin film photovoltaics; Organic electronics and photovoltaics (jointly with CPP, HL, O); Organic thin films; Trends in atomic layer deposition (Focused session)

DS 44.52: Poster

Friday, March 30, 2012, 09:30–12:00, Poster E

Ellipsometry and UPS-IPS Measurements on MnPc Layers on Silicon — •Francisc Haidu, Daniel Lehmann, Michael Fronk, Georgeta Salvan, and Dietrich R. T. Zahn — Chemnitz University of Technology, Semiconductor Physics, D-09107 Chemnitz, Germany

Spectroscopic Ellipsometry (SE) is an elegant technique to monitor in situ changes in the optical response of thin films. Moreover, physical quantities, e.g. optical constants and optical band gap can be determined from the data evaluation. The transport band gap can be determined using the combination of Ultraviolet Photoelectron Spectroscopy (UPS) with Inverse Photoelectron Spectroscopy (IPS). Phthalocyanines, in general, are well known for their physical and chemical stability. Manganese Phthalocyanine (MnPc), in contrast, has high affinity towards oxygen. MnPc thin films were studied by in situ SE and UPS in combination with IPS. Monitoring by SE was performed during thermally evaporating onto Si substrates and during exposure of the MnPc films to air, clean oxygen, and nitrogen, respectively. We see changes in the optical response due to oxidation. The optical band gap as obtained from the SE data is compared to the transport gap derived from UPS-IPS measurements.