Berlin 2012 – scientific programme
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HL: Fachverband Halbleiterphysik
HL 26: Poster Session: Heterostructures - Preparation and Characterization - Impurities / Amorphous Semiconductors
HL 26.7: Poster
Monday, March 26, 2012, 16:00–19:00, Poster D
Electronmicroscopical preparation of nanowires grown perpendicular to the substrate without loss of orientation information — •Sally Rieß1,2, Martin Mikulics1,2, Beata Kardynal1,2, Anna Haab1,2, Fabian Haas1,2, Hilde Hardtdegen1,2, and Detlev Grützmacher1,2 — 1Peter Grünberg Institut - 9, Forschungszentrum Jülich, 52425 Jülich, Germany — 2JARA-Fundamentals of Future Information Technology
The structural properties of nanowires and the templates they are attached to give insights into their formation process. It is therefore important to analyze the wires by transmission electron microscopy (TEM) without removing them from their initial position. To this end the nanowire samples need to be transparent to the electron beam and are therefore thinned down to a few tens of nanometers. They are filled up first with a preferably conductive material for mechanical stability. Thin lamellae are then prepared by focused ion beam methods (FIB). Usually metals are used as the filling material - a time consuming and complex procedure. Additionally the metals could unintentionally alter the sample and impair the investigation of other metals on the wires` surfaces. A fast and inexpensive alternative process to fill up the wires is by spin-coating the sample with a conductive polymer. We will present the development of this process as well as the result after optimization: a lamella with nanowires fully encompassed in conductive polymer produced in only a few minutes time. The method may also be employed in future in contacting schemes for nanowires.