Berlin 2012 – scientific programme
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HL: Fachverband Halbleiterphysik
HL 79: Photovoltaics: General Aspects
HL 79.4: Talk
Thursday, March 29, 2012, 11:15–11:30, EW 201
Application of series resistance imaging techniques to Cu(In,Ga)Se2 solar cells — •Felix Daume1,2, Andreas Rahm1, and Marius Grundmann2 — 1Solarion AG, Ostende 5, 04288 Leipzig, Germany — 2Institut für Experimentelle Physik II, Universität Leipzig, Linnéstraße 5, 04103 Leipzig, Germany
Cu(In,Ga)Se2 thin film solar cells on flexible polyimide foil enable innovative applications as well as a fabrication in a continuous roll-to-roll process and currently reach efficiencies up to 18.7 %. In order to optimize the solar cell efficiency via reduction of inherent losses in the cell, a spatially resolved access to parameters characterizing ohmic losses, i.e. the series resistance, is highly advantageous.
We apply two different interpretation methods from the literature to our material system which enable the calculation of a mapping of the series resistance from electroluminescence images taken at different voltages. Both methods will be demonstrated, compared and discussed on an example. Furthermore, the benefit of such a method for the characterization of solar cells under accelerated aging conditions (damp heat) which is important for the estimation of the long-term stability will be shown.