Berlin 2012 – scientific programme
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KR: Fachgruppe Kristallographie
KR 4: Joint Session "Multiferroics III - Strain / New Routes towards Multiferroicity" (MA jointly with DF, DS, KR, TT)
KR 4.8: Talk
Tuesday, March 27, 2012, 11:15–11:30, EB 301
Strain Determination in Magnetoelectric Composite Systems by X-ray Diffraction Methods — •Christian Koops1, Madjid Abes1, Stjepan Hrkac1, Bridget Murphy1, Olaf Magnussen1, Eric Woltermann2, Henry Greve2, and Eckhard Quandt2 — 1Institut für Experimentelle und Angewandte Physik, Christian-Albrechts-Universität zu Kiel, Germany — 2Institut für Materialwissenschaft, Christian-Albrechts-Universität zu Kiel, Germany
Understanding the coupling at the interface between magnetostrictive and piezoelectric components in magnetoelectric composites (ME) is essential for the optimization of these composites for sensor applications. A large ME response is only possible if the lattice deformation induced by an external magnetic field in the magnetostrictive material can be transferred efficiently to the piezoelectric material. To study this coupling at the burried interface of ME composites we measured the lattice deformation in ZnO as the piezoelectric component by grazing incidence X-ray diffraction in an external magnetic field, using the high-resolution and high intensity X-ray beam provided by the Diamond Light Source (I16) and PETRA III (P08). We employ samples with thin layers of different magnetostrictive materials, (Fe90Co10)78Si12B10 and Terfenol-D, on the (001) surface of high quality, single crystalline ZnO substrates. From the Bragg peak positions we determined the interplanar spacings in the ZnO substrates close to the interface and the corresponding strain as a function of the applied magnetic field.