Berlin 2012 – wissenschaftliches Programm
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KR: Fachgruppe Kristallographie
KR 7: Joint Session "Soft X-ray Resonant Scattering for Complex Structural and Magnetic Investigations" (MA jointly with KR), Organization: Eberhard Goering (MPI-IS Stuttgart)
KR 7.1: Hauptvortrag
Mittwoch, 28. März 2012, 09:30–10:00, BH 243
Soft X-ray Resonant Magnetic Reflectometry of Ferromagnet/Antiferromagnet Interfaces - Probing the Origin of Exchange Bias — •Sebastian Brück1, Gisela Schütz2, Kannan M. Krishnan3, and Eberhard Goering2 — 1University of New South Wales and Australian Nuclear Science and Technology Organization, Sydney, Australia — 2Max-Planck-Institut für Intelligente Systeme, Stuttgart, Germany — 3University of Washington, Seattle, USA
Magnetic interface coupling effects such as exchange bias, the coupling of a ferromagnet to an adjacent antiferromagnet, are very difficult to probe directly by volume integrating techniques due to the small interface to volume ratio. During the last decade, soft x-ray resonant magnetic reflectometry has proven to be a powerful new tool to tackle this problem. Its combination of element selective magnetic sensitivity and high resolution depth profiling capability allows probing even very small magnetic effects at an interface. Investigations by different groups on a broad variety of exchange bias systems based on FeF2, MnPd, CoO, and IrMn have revealed a complex magnetic configuration at the interface. The antiferromagnet shows uncompensated rotatable magnetic moments which are confined to the direct neighborhood of the ferromagnet but also exotic pinned uncompensated magnetic moments. Especially the latter are interesting for our understanding of exchange bias since they should be responsible for the hysteresis loop shift in these systems. We review recent findings in the field and use them to illustrate the capabilities of SXRMR for the investigation of magnetic interface effects.