Berlin 2012 – wissenschaftliches Programm

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MA: Fachverband Magnetismus

MA 38: MagneticThin Films I

MA 38.10: Vortrag

Donnerstag, 29. März 2012, 12:00–12:15, H 0112

Structural characterisation of exchange biased thin film systems with Grazing Incidence X-ray Diffraction — •Markus Meyl and Arno Ehresmann — Department of Physics and Center for Interdisciplinary Nanostructure Science and Technology (CINSaT), University of Kassel, Heinrich-Plett-Str. 40, D-34132 Kassel

Exchange biased thin film systems are structurally characterised by Grazing Incidence X-ray Diffraction (GIXRD) realized with the X-ray Guinier thin film goniometer Huber G 653. This goniometer uses the Guinier process, which is based on the Seemann-Bohlin geometry. In the latter geometry the line focus of the X-ray tube, the surface of the sample and the detector entrance slit are located on a constant focussing cylinder. To improve the Seemann-Bohlin geometry for thin film measurements, the Gunier process uses a focussing monochromator between the X-ray tube and the thin film system for achieving strictly monochromatic X-rays. The angle of incidence between the incident X-rays and the surface of the sample is very small (0° - 10°) to achieve a large effective distance in the thin films and thereby higher diffraction intensities. As a consequence the Guinier thin film Goniometer is especially suitable for analysing thin polycrystalline films on crystalline or amorphous substrates. From the diffraction spectrum the lattice parameters, the indices of the atomic planes and the crystallite sizes can be calculated. Exemplary results of exchange biased thin film systems will be presented with a focus on crystallite sizes.