MI 3: Scanning probe microscopy
Montag, 26. März 2012, 12:45–13:45, EMH 225
 |
12:45 |
MI 3.1 |
Chemical nano-imaging of thin surface layers by combining AFM with tip-localized infrared spectroscopy — Sergiu Amarie and •Fritz Keilmann
|
|
|
|
13:00 |
MI 3.2 |
New generation micro vacuum gauge for ultra high vacuum measurements using modified AFM tips — •Amra Avdic, Anna-Maria Lausch, Alois Lugstein, and Emmerich Bertagnolli
|
|
|
|
13:15 |
MI 3.3 |
All-Metal Cantilevers for Kelvin Force Microscopy — •Raul D. Rodriguez, Franziska Lüttich, Susanne Müller, Daniel Lehmann, and Dietrich R. T. Zahn
|
|
|
|
13:30 |
MI 3.4 |
Extracting intrinsic cantilever properties from thermal noise — •Jannis Lübbe, Matthias Temmen, Philipp Rahe, Angelika Kühnle, and Michael Reichling
|
|
|