Berlin 2012 – wissenschaftliches Programm
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MI: Fachverband Mikrosonden
MI 5: X-ray spectrometry and analysis of works of art
MI 5.2: Hauptvortrag
Mittwoch, 28. März 2012, 10:15–11:00, TA 201
From micro to nano - new X-ray techniques as depth sensors for material characterization — •Ioanna Mantouvalou1, Lars Lühl1,2, Marcel Pagels1, Wolfgang Malzer1, and Birgit Kanngießer1 — 1Technische Universität Berlin — 2Bundesanstalt für Materialforschung und -prüfung, Berlin
Due to their high penetration depth in matter X-rays render the analysis of the inside of material feasible. While for hard X-rays information can be gathered from a few tens of micrometers to even millimeters, soft X-rays are sensitive for nano-scale features. In both regimes new technological developments offer additional techniques which can satisfy the growing demand for novel analytical methods.
While soft X-ray spectroscopy is used widely at large scale facilities like synchrotrons, laboratory based investigations have up until now been hindered due to a lack of suitable radiations sources with sufficient brilliance. Laser-produced plasma sources can fill this gap. With the right choice of laser and target parameters the optimal emission energy can be tailored according to the experiment at hand.
In this presentation examples for depth resolved investigations on the micro- and nano-meter scale will be given. The application of 3D Micro- X-ray fluorescence spectroscopy (XRF) in the field of cultural heritage will be demonstrated on reverse glass paintings. Grazing incidence XRF is shown to be very well suited for nanometer depth resolved characterization of thin film solar cells. The spectroscopic possibilities of laser plasma sources as new X-ray sources are discussed with these investigations at hand.