Berlin 2012 – wissenschaftliches Programm
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MI: Fachverband Mikrosonden
MI 6: X-ray imaging, holography and tomography
MI 6.2: Vortrag
Mittwoch, 28. März 2012, 12:45–13:00, TA 201
Hard x-ray scanning microscope with chemical, elemental and structural contrast — •Jens Patommel1, Christian G. Schroer1, Manfred Burghammer2, and Gerald Falkenberg3 — 1Institute of Structural Physics, Technische Universität Dresden, D-01062 Dresden, Germany — 2European Synchrotron Radiation Facility ESRF, B. P. 220, F-38043 Grenoble Cedex, France — 3HASYLAB at DESY, Notkestr. 85, D-22607, Hamburg, Germany
We designed, built and are now operating a scanning microscope for hard x rays at the synchrotron radiation facility PETRA III at DESY. The instrument uses nanofocusing refractive lenses (NFLs) to generate an intense x-ray nanobeam with a size of between 50 nm and 100 nm. The nanoprobe supports a variety of contrast mechanisms like x-ray absorption spectroscopy, fluorescence spectroscopy, small/wide angle x-ray scattering, and coherent diffraction contrast, retrieving chemical, elemental and structural information from inside the specimen. Although the spatial resolution in direct measurement is limited by the beam size, a much better resolution is achieved with ptychography, combining coherent x-ray diffraction imaging with scanning techniques. All these contrast mechanisms can be performed in tomography mode to retrieve the three-dimensional contrast distribution.
In my talk I will address theoretical considerations of hard x-ray scanning microscopy as well as instrumental aspects of the nanoprobe at PETRA III. I will also present examples for each of the contrast mechanisms.