Berlin 2012 – wissenschaftliches Programm
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MI: Fachverband Mikrosonden
MI 8: Poster – Microanalysis and microscopy
MI 8.5: Poster
Mittwoch, 28. März 2012, 15:00–17:30, Poster E
Refinement of diffraction contrast tomography data by EBSD measurements at selected cross sections — •Melanie Syha1, Andreas Graff2, Frank Altmann2, Daniel Weygand1, and Peter Gumbsch1,2 — 1Karlsruhe Institute of Technology, Institute for Applied Materials, Kaiserstr. 12, 76131 Karlsruhe, Germany — 2Fraunhofer Institute for Mechanics of Materials IWM, Freiburg and Halle, Germany
The evolution of the 3D microstructure in SrTiO3 ceramic during annealing was studied by diffraction contrast tomography (DCT).
Since 3D orientation and microstructure data are analyzed with special emphasis on the local interface orientation, a good spacial resolution at the grain boundaries is of particular importance. For the non destructive DCT measurements of SrTiO3 the sample size is about 0.2mm3. The precision of the grain shape measurements is a few microns. Grain boundaries are reconstructed by expanding the grains up to contact. To check the validity of these process EBSD measurements were performed on selected cross sections. Therefore cross sections at defined positions were produced by grinding and polishing. Due to the simple cubic perowscite structure fast EBSD measurements could be done on the whole cross section with one micron resolution.
The higher resolution makes smaller grains detectable. Also the shape of the grains and the pores is better defined. The EBSD microstructure data allow a classification of the grain boundaries at the selected cross sections. The spatial resolution of the EBSD data can be used to improve the tomography data analysis.