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Sun, 16:00–18:15 |
EW 202 |
MI 1: Innovations in synchrotron X-ray studies |
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Mon, 09:30–12:15 |
EMH 225 |
MI 2: TEM- and SEM-based material analysis |
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Mon, 12:45–13:45 |
EMH 225 |
MI 3: Scanning probe microscopy |
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Tue, 09:30–12:45 |
EMH 225 |
MI 4: 100 years since the Laue experiment: Topical aspects of diffraction and scattering (Joint Session KR, BP, DF, GP, MA, MI, MM; related to SYXD) |
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Wed, 09:30–12:15 |
TA 201 |
MI 5: X-ray spectrometry and analysis of works of art |
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Wed, 12:30–14:30 |
TA 201 |
MI 6: X-ray imaging, holography and tomography |
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Wed, 15:00–17:30 |
Poster E |
MI 7: Poster – 100 years since the Laue experiment: Topical aspects of diffraction and scattering (Joint Session KR, BP, DF, GP, MA, MI, MM; related SYXD) |
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Wed, 15:00–17:30 |
Poster E |
MI 8: Poster – Microanalysis and microscopy |
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