Berlin 2012 – wissenschaftliches Programm

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MM: Fachverband Metall- und Materialphysik

MM 17: Poster Session

MM 17.89: Poster

Montag, 26. März 2012, 17:00–19:00, Poster B

Advanced EBSD/EDS integration for efficient and modern materials characterization — Daniel Goran, Laurie Palasse, and •Thomas Schwager — Bruker Nano GmbH, Schwarzschildstrasse 12, 12489, Berlin, Germany

Recent software and hardware developments have greatly increased the speed at which simultane-ous Electron BackScatter Diffraction (EBSD) and Energy Dispersive X-Ray Spectroscopy (EDS) mapping can be done. We will demonstrate that new developments have transformed the combina-tion of these techniques into a powerful tool for characterizing multiphase materials with improved efficiency and data quality, introducing new ways of using the two complementary techniques to ensure data integrity.

It is well known that the information delivered either by EBSD or by EDS alone is not enough to successfully distinguish the different phases present, like for phases creating similar patterns or sim-ilar chemical composition. Typical examples are quartz and cristobalite, rutile and magnetite.. The new approach consists of simultaneously acquiring an EBSP and a complete EDS spectrum for each point in the map (up to 500 points/sec), then a two-step online/offline analysis method can be used to automatically discriminate phases creating similar patterns using the quantified EDS results to decide or narrow down the phase in each point, finding the correct crystallographic orientation for that particular point. Moreover, if one or more unknown/unexpected phases are present, the EDS information can be used for offline phase identification (up to 54000 points/sec).