Berlin 2012 – wissenschaftliches Programm

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MM: Fachverband Metall- und Materialphysik

MM 31: Nanocharacterization

MM 31.2: Vortrag

Mittwoch, 28. März 2012, 10:30–10:45, H 1029

Characterization of nano-particle size and orientation using auto-correlation analysis of electron microscopy images — •Thomas Weiß, Dieter Akemeier, and Andreas Hütten — Universität Bielefeld, 33615 Bielefeld, Germany

The determination of the size, in particular the size-distribution, of nano-particles has been carried out so far by counting each particle. This method is time consuming, whence an automated method is desired to avoid this procedure.

Images of nano-particles taken by electron microscopy are analysed by auto-correlation analysis. Using auto-correlation analysis it allows one to determine the concentration of the particles, the size-distribution and, if existent, the oriented alignment. In order to compare these results nano-particles on an image plane are simulated, where the further analysis has been made by auto-correlation.

This method can be applied to images of any kind, for example of nano-particles observed in electron microscopy or cross sections of magnetic beads.