Berlin 2012 – wissenschaftliches Programm
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MM: Fachverband Metall- und Materialphysik
MM 31: Nanocharacterization
MM 31.4: Vortrag
Mittwoch, 28. März 2012, 11:00–11:15, H 1029
X-ray Raman scattering: A spectroscopic tool to study low Z elements at extreme pressure and temperature — •Kolja Mende1, Alexander Nyrow1, Christian Sternemann1, Christian Schmidt2, Max Wilke2, Christoph J. Sahle1, Thorsten Brenner1, Laura Simonelli3, Marco Moretti Sala3, and Metin Tolan1 — 1Fakultät Physik / DELTA, TU Dortmund, Dortmund, Germany — 2Geoforschungszentrum Potsdam, Potsdam, Germany — 3European Synchrotron Radioation Facility, Grenoble, France
In situ studies of materials under conditions of geological relevance, i.e. high pressure and high temperature, can only be performed using diamond anvil cells in combination with resistive or laser heating. Due to highly absorbing sample environments, the study of absorption edges for binding energies between 10 eV and 2 keV of low and intermediate Z elements such as sodium, aluminum, silicon, etc. is hardly possible using electron or soft x-ray spectroscopy. Here, x-ray Raman scattering (XRS), an energy loss spectroscopy using hard x-rays as a probe, provides a unique experimental method. XRS yields similar information as soft x-ray absorption and electron energy loss spectroscopy. It is very sensitive to changes of the electronic and local atomic structure and allows to probe different excitation channels by variation of the momentum transfer. With this method, the partial unoccupied density of states can be determined. The capabilities of this experimental technique for geophysical applications are discussed for selected examples.