Berlin 2012 – scientific programme

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MM: Fachverband Metall- und Materialphysik

MM 33: Topical Session Theory meets Experiment II - Nanocomposites and Microstructure

MM 33.1: Topical Talk

Wednesday, March 28, 2012, 11:30–12:00, TC 006

Correction of spherical and chromatic aberration: towards the ultimate performance in transmission electron microscopy — •Joachim Mayer — Central Facility for Electron Microscopy, RWTH Aachen University, 52074 Aachen and Ernst Ruska-Centre, Forschungszentrum Jülich, 52425 Jülich

The introduction of aberration correctors has revolutionized the development of TEM and STEM instrumentation. Only shortly after the development and installation of the first TEM with a corrector for the spherical aberration [1], commercial instruments with aberration correctors are now offered by all major manufacturers. In order to provide a platform for these novel developments and based on the experience with the first aberration corrected TEM [2], Research Centre Juelich and RWTH Aachen University have jointly founded the Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C). With the recent installation of PICO, the second high resolution TEM in the world which is equipped with a corrector for the chromatic aberration, a broad range of new methods is now available. Research at the Ernst Ruska-Centre focuses on the development of new quantitative methods in TEM and on their application in materials science and solid state physics [3]. The most important fields of application are nanoelectronics and nanomaterials for energy-related systems. [1] M. Haider, H. Rose, S. Uhlemann, E. Schwan, B. Kabius, and K. Urban, Nature 392 (1998) 768. [2] C.L. Jia, M. Lentzen, and K. Urban, Science 299 (2003) 870. [3] C. L. Jia, S. B. Mi, K. Urban, I. Vrejoiu, M. Alexe, D. Hesse, Nat. Mater. 7 (2008) 57.